Xxera/openscience/retractions

Record #21732

Objective Total Isotropic Sensitivity Measurement

Yihong Qi, Jiyu Wu, Zheng Zhang, Lie Liu, Wei Yu, Antonio Orlandi, Jun Fan, Zhiping Yang

Journal

IEEE Transactions on Electromagnetic Compatibility

Publisher

IEEE: Institute of Electrical and Electronics Engineers

Original paper date

Jun 5, 2017

Original DOI

10.1109/TEMC.2017.2707641

Country

🇨🇳 China · 🇮🇹 Italy · 🇺🇸 United States

Institution

General Test Systems, with the Hunan University, Shenzhen, Changsha, China · General Test Systems, Shenzhen, China · UAq Electromagnetic Compatibility Laboratory, University of L'Aquila, L'Aquila, Italy · Missouri University of Science and Technology, Rolla, MO, USA · Google, Mountain View, CA, USA

Open access

No

Article type

Research Article

Broad categories

(PHY) Engineering - Electrical

Citation lifecycle

How this paper is being cited

Pre-retraction

0

Same day

0

Post-retraction

8

% post-retraction

100.0%

~0.0 citations/yr before retraction · ~0.9 citations/yr after

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