Xxera/openscience/retractions

Record #22096

Encircling probe with multi-excitation frequency signal for depth crack defect in eddy current testing

J K S Paw, K Ali, C K Hen, A N Abdallah, T J Ding, N A Ahlam, N Eirfan

Journal

Journal of Fundamental and Applied Sciences

Publisher

University of El Qued

Original paper date

Mar 7, 2018

Original DOI

10.4314/jfas.v10i6s.45

Country

🇨🇳 China · 🇲🇾 Malaysia

Institution

Faculty of Electronic Information Engineering, Huaiyin Institute of Technology, Huai’an Jiangsu, China · Institute of Sustainable Energy (ISE), UNITEN, 43000 Selangor, Malaysia · Faculty of Electrical and Automation Engineering Technology, TATIUC, 24000 Terengganu, Malaysia

Open access

No

Article type

Conference Abstract/Paper

Broad categories

(PHY) Engineering - Structural

Citation lifecycle

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Pre-retraction

0

Same day

0

Post-retraction

0

% post-retraction

0.0%

~0.0 citations/yr before retraction · ~0.0 citations/yr after

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