Xxera/openscience/retractions

Record #22219

Reliability assurance in early-life-failure test through improved nearest neighbor regression

Tai Song, Huaguo Liang, Zhengfeng Huang, Jie Hou

Journal

IEICE Electronics Express

Publisher

The Institute of Electronics, Information and Communication Engineers

Original paper date

Dec 13, 2019

Original DOI

10.1587/elex.16.20190696

Country

🇨🇳 China · 🇩🇪 Germany

Institution

Dept. of Electronic Science and Applied Physics, Hefei University of Technology, Hefei 230009, China · Institute of computer Architecture and computer, Stuttgart University, Stuttgart D-70569, Germany

Open access

No

Article type

Research Article

Broad categories

(B/T) Business - Manufacturing (B/T) Computer Science

Citation lifecycle

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Pre-retraction

0

Same day

0

Post-retraction

0

% post-retraction

0.0%

~0.0 citations/yr before retraction · ~0.0 citations/yr after

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