Record #35622
Review on Radiation Hardness Assurance by Design, Process and NextGen Devices
Publisher
Original paper date
Mar 25, 2021
Original DOI
Broad categories
Citation lifecycle
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Pre-retraction
0
Same day
0
Post-retraction
5
% post-retraction
100.0%
~0.0 citations/yr before retraction · ~1.1 citations/yr after
— citing papers
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