Xxera/openscience/retractions

Record #6122

Investigation of structural, optical and electronic properties in Al–Sn co-doped ZnO thin films

Zhanchang Pan, Xinlong Tian, Shoukun Wu, Xia Yu, Zhuliang Li, Jianfeng Deng, Chumin Xiao, Guanghui Hu, Zhigang Wei

Journal

Applied Surface Science

Publisher

Original paper date

Dec 3, 2012

Original DOI

10.1016/j.apsusc.2012.11.139

Country

Institution

School of Chemical Engineering and Light Industry, Guangdong University of Technology, Guangzhou, Guangdong 510006, China Huizhou King Brother Electronic Technology Co. Ltd, Huizhou 516083, China

Open access

No

Article type

Research Article

Broad categories

(PHY) Engineering - Electrical (PHY) Materials Science

Citation lifecycle

How this paper is being cited

Pre-retraction

20

Same day

0

Post-retraction

24

% post-retraction

54.5%

~7.4 citations/yr before retraction · ~2.2 citations/yr after

— citing papers

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