Record #62692
An improved software defect prediction model based on grey incidence analysis and Naive Bayes algorithm
Original paper date
Sep 22, 2022
Original DOI
Country
Open access
No
Article type
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Notes from Retraction Watch
An earlier publication date of the original article can be found in: https://dl.acm.org/doi/abs/10.3233/JIFS-213570
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0
Same day
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Post-retraction
2
% post-retraction
100.0%
~0.0 citations/yr before retraction · ~1.0 citations/yr after
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