Xxera/openscience/retractions

Record #7766

Effect of thickness of Bi1.5Zn1.0Nb1.5O7 gate insulator on performance of ZnO based thin film transistors

Wei Ye, Jianping Deng, Xufei Wang, Likun Cui

Journal

Applied Surface Science

Publisher

Original paper date

Aug 31, 2016

Original DOI

10.1016/j.apsusc.2016.08.153

Country

Institution

School of Mechanical Engineering, Shaanxi SCI-TECH University, Hanzhong, 723001, China · Shaanxi Key Laboratory of Industrial Automation, Shaanxi SCI-TECH University, Hanzhong, 723001, China

Open access

No

Article type

Research Article

Broad categories

(PHY) Chemistry (PHY) Engineering - Chemical (PHY) Materials Science

Citation lifecycle

How this paper is being cited

Pre-retraction

1

Same day

0

Post-retraction

5

% post-retraction

83.3%

~0.9 citations/yr before retraction · ~0.6 citations/yr after

— citing papers

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